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Editor-in-chief

LIU Yichun

Academician of Chinese Academy of Sciences

Northeast Normal University

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About the Journal

    Chinese Journal of Vacuum Science and Technology (CJVST) is national level scientific journal operated by the Chinese Vacuum Society and approved by the Chinese Association for Science and Technology. CJVST pressed the first volume in 1981. Since then, CJVST has been listed as a Chinese Science Citation Database (CSCD) journal and Chinse Core Journal. CJVST publishes Chinese and English research papers on vacuum acquisition, improvement, testing, and application, involving the intersection of physics, chemistry, engineering, materials, biology and other disciplines.

Issue 06,2025

The Novel Design of Vacuum Safety Interlock System for New Beamline at Hefei Light Source

LIU Qun;CHEN Liuguo;LI Fang;JIA Wenhong;WANG Xiao;HE Bo;

The vacuum safety interlock system of the beamline station is an important basis for guaranteeing the safe operation of the storage ring and the safety of equipment on the beamline station. The latest design method of the vacuum safety interlock system for the beamline and its stations, which is being newly built at Hefei Light Source is introduced. Based on the latest programmable logic controller(PLC) and virtualization technologies under the architecture of the open software platform EPICS 7(Experimental Physics and Industrial Control System), a new vacuum safety interlock system for the beamline and its stations has been developed. In the development of the operator interface(OPI) for remote control of the system, a Python script is used to automatically generate OPI with one click, which improves the efficiency of system development. Overall, this design improves the system performance and user experience of human-computer interaction while ensuring the safety and reliability of the system. These design methods provide technical reserves and practical experience for the control of the beamline at the Hefei Advanced Light Facility under construction.

Issue 06 ,2025 v.45 ;
[Downloads: 48 ] [Citations: 0 ] [Reads: 0 ] HTML PDF Cite this article

Application of Highly Accelerated Life Test in Reliability Test of Cracker Source

CHEN Dongdong;GUO Wei;ZHANG Zhufeng;XIE Binping;GAO Hanchao;

The cracker source is the core component of ultra-high vacuum molecular beam epitaxy(MBE)equipment, which can be used to grow a variety of III-V semiconductor materials epitaxy such as GaAs, InP, GaSb,etc. Because the ultra-high vacuum is not easy to obtain during the use of MBE, the reliability of the cracker source is very high. In this paper, the principle and method of high stress acceleration test of arsenic cracker source for molecular beam epitaxy equipment are discussed, and the corresponding acceleration test scheme is designed according to the characteristics of the cracker source. Based on the high temperature stress acceleration model, the acceleration factor was determined, the acceleration test profile was developed, and the mean time between failure(MTBF) value of the cracker source was determined to be greater than 5000 h according to the test scheme. The scheme provides a reference for engineering applications for the reliability verification of vacuum devices and scientific instruments with high reliability index and tight number of samples tested.

Issue 06 ,2025 v.45 ;
[Downloads: 63 ] [Citations: 0 ] [Reads: 0 ] HTML PDF Cite this article

Investigation of Thermo-Oxidative Aging Effects on Sealing Performance of Spacecraft Elastomeric Seals

SHI Jijun;WANG Lina;SUN Lichen;ZHANG Jin;GUO Fei;QI Lei;LIU Enjun;GUO Chongwu;

The sealing performance serves as a critical indicator for spacecraft rubber sealing systems, where the degradation behavior of rubber materials directly determines the service life of these systems. Current research on rubber sealing performance evolution primarily focuses on qualitative studies of macroscopic contact properties or specific mechanical property variations, with limited quantitative investigations on leakage rate calculations based on seal leakage channels. This paper establishes a microscopic leakage model for spacecraft-grade ethylenepropylene-diene monomer(EPDM) rubber by analyzing interfacial leakage channels and molecular flow characteristics of the gas, with theoretical leakage rate calculations validated through experimental measurements.The compression set of rubber materials was tested using time-temperature equivalence theory, and a thermaloxidative aging mathematical model was developed for lifespan prediction. Stress-strain constitutive relationships were obtained for rubber materials subjected to various thermal-oxidative aging conditions, with the measured relationships incorporated into finite element models for sealing performance analysis. A microscopic leakage model considering thermal-oxidative aging effects was established by analyzing pre-/post-aging surface micro-morphology and calculating contact pressure/width variations. Leakage rates under different thermal-oxidative aging conditions were calculated, with experimental leakage rate measurements validating the theoretical results.

Issue 06 ,2025 v.45 ;
[Downloads: 92 ] [Citations: 0 ] [Reads: 0 ] HTML PDF Cite this article

Simulation on the Photoionization Source of Mass Spectrometry by NS-DSMC Method

GAO Shijun;HUANG Jun;HE Ziyang;BI Hailin;WANG Xudi;LIU Chengyuan;YANG Jiuzhong;XU Minggao;PAN Yang;

Understanding the gas dynamics characteristics of the mass spectrometry(MS) ion transport system is important for improving the sensitivity of MS instruments. Based on the coupled of the Navier-Stokes equation and the Direct Simulation Monte Carlo method, the flow field characteristics of the gas from the atmospheric pressure continuous flow to the vacuum rarefied flow can be calculated. Further coupling with the electric field simulation, ions' transportation, and spatial distribution information can be obtained, and the performance of ion optical devices can be evaluated. Based on photoionization mass spectrometry, this work constructed a combined structural model of capillary injection, photoionization source, and sampling cone, established a multi-physics simulation method for ion transportation across flow regimes, obtained the effects of two types of structured photoionization source electrodes on the ion transportation efficiency, and verified the reliability of the simulation method using a self-made photoionization time-of-flight mass spectrometer. This work provides theoretical guidance for the design of mass spectrometry photoionization sources and ion transportation instruments under complex flow and electric field environments.

Issue 06 ,2025 v.45 ;
[Downloads: 78 ] [Citations: 0 ] [Reads: 0 ] HTML PDF Cite this article

Simulation of the Uniformity Influence of Effusion Cell Structure and Layout in Molecular Beam Epitaxy

TAO Xiantong;DUAN Yingrui;LI Zhuangzhuang;SONG Liyuan;YANG Chunzhang;YANG Jin;LI Yanhui;KONG Jincheng;ZHAO Jun;JI Rongbin;WANG Shanli;

Billion-pixel infrared detectors are an important direction for the development of next-generation infrared detectors, and the 8-inch high-uniform Hg1-x Cdx Te thin film has become the most crucial component of this technology. The structure and layout of molecular beam epitaxy(MBE) effusion cells are key factors influencing the composition and thickness uniformity of Hg1-x Cdx Te epitaxy films. This paper theoretically analyzes the beam flux generation and emission distribution of effusion cells based on requirements for large-area high-uniformity Hg1-xCdx Te epitaxial films. It simulates and calculates the impacts of effusion cell layout and the usage of source materials within the cells on the thickness uniformity of epitaxial thin films. This article takes a cylindrical channel effusion cell as an example and uses COMSOL Multiphysics to simulate the MBE growth process with different distances and different angles from the effusion cell of MBE, and the uniformity of the beam reaching the substrate is calculated. The results show that the beam flux decreases nearly linearly with source material consumption. The highest thickness uniformity is achieved when the angle is 46°; as the distance increases, the thickness uniformity becomes better, and after 300 mm, the thickness uniformity is within ±1.5%. This ensures the successful preparation of 8-inch highly uniform Hg1-x Cdx Te thin film.

Issue 06 ,2025 v.45 ;
[Downloads: 98 ] [Citations: 0 ] [Reads: 0 ] HTML PDF Cite this article
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2022 "Chinese Journal of Vacuum Science and Technology " Call for Papers

 

"Chinese Journal of Vacuum Science and Technology (CJVST)", sponsored by the Chinese Vacuum Society and authorized by the Chinese Association for Science and Technology, is a national natural scientific and technological journal which was founded in 1981 and monthly published both at home and abroad. It is indexed in the Internationally renowned retrieval system CA, SA and etc., and the impact factor of the journal continues to increase for two consecutive years.

"Chinese Journal of Vacuum Science and Technology" has columns such as review comments, research bulletins, research papers, popular science columns, and technical exchanges. In 2022, a new column of technical exchange is established mainly for engineers in the vacuum industry to exchange experience and skills in vacuum equipment design, production and other production links. Since this year, this journal has been printed entirely in color. The author should avoid using grayscale images. It is recommended to use color images so as not to affect the printing effect.

Authors at home and abroad are welcome to log in to the journal's online submission system (http://zkkx.cbpt.cnki.net) and download the paper template for submission.

Online submission: http://zkkx.cbpt.cnki.net

Email: cjvst@cvs.org.cn

Wechat official account: Chinese Journal of Vacuum Science and Technology